MedTEST Application Note

IEC/UL 60601-1 3rd Edition

This Application note provides an example of how to test a medical device per IEC/UL 60601-1 3rd Edition using the Associated Research MedTEST System.

Table 1 lists all the instruments shown in the test setup used as an example in this document.

Instrument Name/Model Capabilities and Functions
OMNIA II model 8207 Electrical Safety Compliance Analyzer Ground Bond/Continuity, AC/DC Withstand, Insulation Resistance, Leakage Current, Functional Run and built-in 500 VA AC Source
SC6540 Scanning Matrix Main 16 Channel HV 16 high voltage channels for multi-point testing
SC6540 Scanning Matrix Secondary 8 Channel HV 8 high voltage channel for additional test points
Associated Power Technologies model APT320XAC Programmable AC output 2 kVA
Class 1 Medical Device with 2 Applied Parts labeled as DUT – Device Under Test Can be any medical device with applied parts. Applied part is a part of Medical Electrical Equipment that in normal use necessarily comes into physical contact with the patient to perform its function.

Table 1

Impedance and Current Carrying Capability (Ground Bond Test)

IEC/UL 60601-1 Clause 8.6.4 Impedance and Current Carrying Capability

MedTEST Application Note - Ground Bond Test ConnectionsMedTEST Application Note - Ground Bond Test Connections

Figure 1 - Ground Bond Test Connections

Active connections are shown in red in Figure 1.

Test Type Points Under Test Active Connections Scanner Channels
Ground Bond DUT GND – DUT Chassis GND and CASE None

Table 2

Dielectric Strength (The Hipot Test)

IEC60601-1 Clause 8.8.3 Dielectric Strength

MedTEST Application Note - Hipot Test ConnectionsMedTEST Application Note - Hipot Test Connections

Figure 2 - Hipot Test Connections

Active connections are shown in red in Figure 2.

Test Type Points Under Test Active Connections Scanner Channels
Hipot DUT Mains to Chassis L, N and Case None

Table 3

Dielectric Strength (Applied Part Hipot Test)

IEC/UL 60601-1 Annex L - Section L. 4

MedTEST Application Note - Hipot Test on Applied PartsMedTEST Application Note - Hipot Test on Applied Parts

Figure 3

Test Type Points Under Test Active Connections Scanner Channels
Applied Part Hipot DUT Mains to Applied Part
(AP1 or AP2)
L, N and Return
*Disconnect GND lug of the 38578 box from OMNIA and the Case connection
Scanner 1: CH15 or CH16 set to Lo
Applied Part to DUT Mains AP1 or AP2 and DUT
L, N or GND
*Disconnect GND lug of the 38578 box from OMNIA and the Case connection
---

Table 4

Leakage Current and Patient Auxiliary Current

IEC/UL 60601-1 Clause 8.7 Leakage Current and Patient Auxiliary Current* (The Leakage Current Test)

MedTEST Application Note - Earth Leakage TestMedTEST Application Note - Earth Leakage Test

Figure 4

Test Type Points Under Test Active Connections Scanner Channels
LCT - Earth Leakage N and GND L, N and GND None

Table 5

MedTEST Application Note - Enclosure Leakage TestMedTEST Application Note - Enclosure Leakage Test

Figure 5

Test Type Points Under Test Active Connections Scanner Channels
LCT - Enclosure Leakage Enclosure points
(EP1 or EP2)
L, N and Probe Hi
*LCT - Enclosure Leakage
Scanner 1: CH 9 Hi and CH15/CH16 Hi depending on point under test.

Table 6

MedTEST Application Note - Applied Part LeakageMedTEST Application Note - Applied Part Leakage

Figure 6

Test Type Points Under Test Active Connections Scanner Channels
LCT - Applied Part Leakage Applied Parts AP1 and/or AP2
*There can be more than two applied parts
L, N and Probe Hi and Probe Lo
*Probe Configuration – Probe Hi to Line for single Applied part and Probe Hi to Probe Lo for testing between two Applied Parts
Scanner 1: Single applied part – CH9 Hi and CH15/16 Hi
Two Applied parts – (CH9 and CH15) Hi (CH10 and CH16) Lo

Table 7

MedTEST Application Note - Mains on Applied Part LeakageMedTEST Application Note - Mains on Applied Part Leakage

Figure 7

Test Type Points Under Test Active Connections Scanner Channels
LCT - Mains Applied Part Leakage L, N, Probe Hi and Probe Lo L, N and Probe Hi and Probe Lo
*Probe Configuration – Probe Hi to Probe Lo
Scanner 1: (CH7 and CH1) Hi
Scanner 2: (CH1 and CH8) HI, (CH6 and CH7) Lo

Table 8